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atomic force microscope
Scanning Probe Microscope (SPM) is a family of microscopes that observe the interactions between sample surfaces and a sharpened probe and measure the field distribution of the surface force, current and optical properties which work between them and present the output in the form of high-resolution 3-dimensional nano-scale images.
Scanning Tunneling Microscope (STM ), observes a form of sample surface using minute "tunneling currents," which flow between the probe and a sample . Atomic Force Microscope (AFM) performs topography imaging using minute "atomic force" produced between a sharpened probe and a sample surface . The technological development of SPM's are rapidly advancing at the pace of that of nanotechnology which is the technology of treating the minute world of atoms and molecules .
related articles
Principles , applications and instrumentations of Scanning Probe Microscopes (SPM) :-
- http://www.veeco.com/pdfs/library/spm_guide_0829_05_166.pdf ( A practical guide to SPM)
- http://mina4-49.mc2.chalmers.se/~fogelstr/Linne_Graduate_course/Microscopes_to_probe_the_quantum_world_files/Fundamentals%20of%20SPM%20Mironov%20eng.pdf (Fundamentals of Scanning Probe Microscopy )
- http://www.eotc.tufts.edu/Documents/AFMFacility/SPM_Training_Notebook_v3.pdf (SPM Training Notebook )
- http://www.research.philips.com/technologies/projects/matanalysis/downloads/spm2005.pdf (SPM - An Overview of Possibilities)
- http://www.columbia.edu/~jcc2161/documents/STM_2ed.pdf ( Introduction to Scanning Tunneling Microscope )
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