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MaxLab Technology (M) Sdn Bhd

Scientific Laboratory Equipment Supplier (since 2007) for Malaysia,Singapore,Vietnam,Indonesia,Philippines,Thailand,Myanmar,Laos,Brunei,Cambodia

atomic force microscope

Scanning Probe Microscope (SPM) is  a family of  microscopes that observe the interactions between  sample surfaces and a sharpened probe and  measure the field distribution of the surface force, current and optical properties which work between them and present the output in the form of high-resolution 3-dimensional nano-scale images.

Scanning Tunneling Microscope (STM ), observes a form of sample surface using minute "tunneling currents," which flow between the probe and a sample .  Atomic Force Microscope (AFM)  performs topography imaging using minute "atomic force" produced between a sharpened probe and a sample surface . The technological development of SPM's are rapidly advancing at the  pace of that of nanotechnology which is  the technology of treating the minute world of atoms and molecules .

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